A quantitative approach for linking baseline sample size to statistics provides a statistically justified basis for ...

As part of a financial statement audit, auditors are required to obtain an understanding of a company's internal control system. Internal control is an interconnected web of policies, procedures, ...

Statistical Process Control (SPC) is a basic approach in industrial engineering that improves the quality and speed of manufacturing processes. Starting in the 1920s, SPC employed statistical methods ...

This research presents a new adaptive exponentially weighted moving average control chart, known as the coefficient of variation (CV) EWMA statistic to study the relative process variability. The ...

Jon Herlocker, co-founder and CEO of Tignis, sat down with Semiconductor Engineering to talk about how AI in advanced process control reduces equipment variability and corrects for process drift. What ...

Controlling Process Flow with the Template Method Pattern If you have a process that needs to be performed -- but with variations -- then implementing the Template Method pattern will give you simpler ...

To ensure success in semiconductor technology development, process engineers must set the allowed ranges for wafer process parameters. Variability must be controlled, so that final fabricated devices ...